We are planning to exhibit the super-precision Ultra Fine JIG, WAFER Probe Card and introduce the 3D test device for wafer at Semicon Korea 2020 held from February 5 ~ 7, 2020.
We will suggest various customized test solutions for your needs.
Please visit our booth.
・Ultra Fine JIG
・Wafer Probe Card
・3D test device for wafer
|Period||From February 5th(Wed) to 7th (Fri), 2020|