SEMICON KOREA 2020
We are planning to exhibit the super-precision Ultra Fine JIG, WAFER Probe Card and introduce the 3D test device for wafer at Semicon Korea 2020 held from February 5 ~ 7, 2020. We will suggest various customized test solutions for your needs. Please visit our booth.
Product list
- Ultra Fine JIG
- Wafer Probe Card
- 3D test device for wafer
Information
| Period | From February 5th(Wed) to 7th (Fri), 2020 |
|---|---|
| Venue | COEX |
| Booth | BL31 |
| Official site |
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