检测・计量设备｜自动电气检测设备｜半导体封装检测装置
GATS®-6310
经营本产品的公司名：Nidec-Read Corporation
Multi-faced CSP Open・Short（Leak） inspection system
0.6 sec/Piece high speed inspection! Next generations’ equipment for fine-pitched & Ultra Thin FC-CSP substrate testing. High speed and high accuracy model is NEW released.
- 特点：
- High speed Step＆Repeat mechanism. Total alignment ±5.0μm(GATS-6310). Embedded substrate test is available. Flexible Head System. High speed testing with cable-less scanner. Universal substrate clump mechanism. Easy fixture docking mechanism.
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- 相关垂询
关于产品的咨询
尼得科精密検測科技株式会社
邮件垂询
电话垂询
+81-75-280-8100
服务时间：9:00～17:30（周六日节假日除外）
