检测・计量设备|自动电气检测设备|半导体封装检测装置
GATS®-7512 for ICS / Memory
经营本产品的公司名:Nidec Advance Technology Corporation
High speed shuttle, step and repeat style
Open/Leak automatic substrate inspection system
- 特点:
- Automatic width adjustment Double-table, shuttle style. Available to embedded IC components test (Option). Comprehensive alignment accuracy. Space-saving stocker. High-precision inspection jig.
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关于产品的咨询
尼得科精密検測科技株式会社
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+81-75-280-8100
服务时间:9:00~17:30(周六日节假日除外)