检测・计量设备｜自动电气检测设备｜半导体封装检测装置
GATS®-7755 for ICS / SLP
经营本产品的公司名：Nidec Advance Technology Corporation
High speed shuttle, step and repeat style, Open/Leak automatic substrate inspection system
High speed & accuracy inspection for Fine Pitch FC-CSP, Next-generation’s inspection system available for core-less substrate!
- 特点：
- Double-table, shuttle style. Comprehensive alignment accuracy. Available to embedded IC components test (Option). High speed inspection with cable-less scanner. Loading Standardized work holder. Wider work, best for core-less substrate.
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关于产品的咨询
尼得科精密検測科技株式会社
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+81-75-280-8100
服务时间：9:00～17:30（周六日节假日除外）
