检测・计量设备｜自动电气检测设备｜印刷电路板检测装置
STAR REC® M6ⅡSW for HDI / HLC
经营本产品的公司名：Nidec Advance Technology Corporation
HDI/Semiconductor High Speed O/S Inspection System
Best Test Equipment for Smart Phone & Tablet PC PWB Inspection
- 特点：
- High Speed Inspection: Tact time 6.0 sec. for 5 faced-substrate. Available to embedded IC components test (Option). Step & Repeat Efficient Inspection. Total Alignment Accuracy±7.5μm. 16k Pin type (8+8k) 32k Pin type(16+16k). Space-saving operation by L/UL integration. Universal Fixture cost 1/5(Compare to dedicated fixture). Test min pitch 300um support in universal adapter. Test min pitch 75um support in dedicated fixture.
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关于产品的咨询
尼得科精密検測科技株式会社
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+81-75-280-8100
服务时间：9:00～17:30（周六日节假日除外）
