触摸屏面板/平板显示器检测装置
STAR REC® M6ⅡSW for HDI / HLC
生产和销售公司：尼得科精密检测科技株式会社
HDI/Semiconductor High Speed O/S Inspection System
Best Test Equipment for Smart Phone & Tablet PC PWB Inspection
High Speed Inspection: Tact time 6.0 sec. for 5 faced-substrate. Available to embedded IC components test (Option). Step & Repeat Efficient Inspection. Total Alignment Accuracy±7.5μm. 16k Pin type (8+8k) 32k Pin type(16+16k). Space-saving operation by L/UL integration. Universal Fixture cost 1/5(Compare to dedicated fixture). Test min pitch 300um support in universal adapter. Test min pitch 75um support in dedicated fixture.
Features 1
HDI/Semiconductor High Speed O/S Inspection System
High Speed Inspection: Tact time 6.0 sec. for 5 faced-substrate. Available to embedded IC components test (Option). Step & Repeat Efficient Inspection. Total Alignment Accuracy±7.5μm. 16k Pin type (8+8k) 32k Pin type(16+16k). Space-saving operation by L/UL integration. Universal Fixture cost 1/5(Compare to dedicated fixture). Test min pitch 300um support in universal adapter. Test min pitch 75um support in dedicated fixture.