December 13 [Wed] – 15 [Fri], 2023
We will be exhibiting the latest solutions including IGBT/SiC module inspection system, large size PKGs electrical test system, thermocouple probe for probe card, vector network analyzer for high frequency impedance, and so on.
Please visit our booth.

Products on Exhibition

■Exhibition Contents (Probe card and vector network analyzer will be on display)
・IGBT/SiC module / ISO / DC / AC / Dynamic Inspection "NATS-series”
・IGBT/SiC module / Dynamic Inspection_“PM Characteristics Acquisition Waveform Analysis Software”
・Test system for EV/e-Axle “TDAS-series”
・Wafer bump optical inspection systems "RSH / RWi series”
・Electrical inspection system for Chiplet (large sized unit) & various semiconductor packages
・High-frequency impedance measurement " Vector Network Analyzer"
・Capacitance/impedance multifunction tester “R-700 Series”
・Automotive probe card “Thermocouple Probe”

Information

When: Wednesday, December 13 – Friday, December 15, 2023
Where: Tokyo Big Sight East Hall
Booth: East 2 Hall 2718
Official site

https://expo.semi.org/japan2023/Public/Enter.aspx