Inspection and measuring equipment｜Automatic electrical inspection equipment｜Semiconductor Package Inspection System
GATS®-6310
companies handling the product：Nidec-Read Corporation
Multi-faced CSP Open・Short（Leak） inspection system
0.6 sec/Piece high speed inspection! Next generations’ equipment for fine-pitched & Ultra Thin FC-CSP substrate testing. High speed and high accuracy model is NEW released.
- characteristics:
- High speed Step＆Repeat mechanism. Total alignment ±5.0μm(GATS-6310). Embedded substrate test is available. Flexible Head System. High speed testing with cable-less scanner. Universal substrate clump mechanism. Easy fixture docking mechanism.
- Contact information for product inquiry
- Contact Us
カタログ
Contact information for product inquiry
Nidec Advance Technology Corporation
inquiry by e-mail
inquiry by phone
+81-75-280-8100
business hours: 9:00 - 17:30 (Mon. - Fri. Weekdays only)
