Inspection and measuring equipment|Automatic electrical inspection equipment|Semiconductor Package Inspection System

GATS®-7755 for ICS / SLP

companies handling the product:Nidec Advance Technology Corporation

High speed shuttle, step and repeat style, Open/Leak automatic substrate inspection system

High speed & accuracy inspection for Fine Pitch FC-CSP, Next-generation’s inspection system available for core-less substrate! substrate patternOpen/Short inspection for Multi-pagination.

Double-table, shuttle style. Comprehensive alignment accuracy. Available to embedded IC components test (Option). High speed inspection with cable-less scanner. Loading Standardized work holder. Wider work, best for core-less substrate.
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Nidec Advance Technology Corporation

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