Inspection and measuring equipment｜Automatic electrical inspection equipment｜Semiconductor Package Inspection System
GATS®-7755 for ICS / SLP
companies handling the product：Nidec Advance Technology Corporation
High speed shuttle, step and repeat style, Open/Leak automatic substrate inspection system
High speed & accuracy inspection for Fine Pitch FC-CSP, Next-generation’s inspection system available for core-less substrate! substrate patternOpen/Short inspection for Multi-pagination.
- Double-table, shuttle style. Comprehensive alignment accuracy. Available to embedded IC components test (Option). High speed inspection with cable-less scanner. Loading Standardized work holder. Wider work, best for core-less substrate.
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Nidec Advance Technology Corporation
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business hours: 9:00 - 17:30 (Mon. - Fri. Weekdays only)