R-780

By performing multi-channel parallel measurement, R-780 series enables high-speed capacitance measurement of semiconductors, MEMS, and PCBs. Additionally, it supports high-speed DC measurement (0.1mΩ to 10TΩ) for continuity and insulation at voltages from 1V to 250V. This series is capacitive touchscreen test system for open test, leak test and capacitance measurement. The unit is available for testing single pieces after cutting and FPC before mounting IC. Capable of testing 16 lines in parallel. Robber type Jig is available for scratch-free testing. ・Testing in High throughput ・High reliability ・High maintainability is applicable