Semiconductor Package Inspection System
GATS®-6310
Company：NIDEC ADVANCE TECHNOLOGY CORPORATION
Multi-Panel CSP Substrate Continuity and Short-Circuit (Insulation) Inspection System
Achieves ultra-high-speed testing at 0.6 seconds per piece!
Introducing the next-generation, high-speed, high-precision inspection system—ideal for testing fine-pitch and ultra-thin FC-CSP substrates.
・High-Speed Step-and-Repeat Mechanism
・Comprehensive alignment accuracy of ±5.0 μm
・Embedded Component Support:
・Flexible Head System
・Cable-less Scanner
・Universal Substrate Clamping
・Smart Alignment