Semiconductor Package Inspection System
GATS®-2300 for FC-BGA Individual package
Company：NIDEC ADVANCE TECHNOLOGY CORPORATION
High-speed precision, rotary index table style, Open/Leak automatic single substrate inspection system
The optimum solution for high-speed inspection of individual circuits BGA-MCM package. It handles the continuous flow process with 8 stations of rotary index tables and loader/unloader circular system.
Features 1
Rotary index table system, continuous operation, high-speed transfer, high accuracy alignment, one-touch jig. Available to embedded IC components test (Option).